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EPMAs (JEOL JXA-8900 and another)
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XRDs (RIGAKU 2013 and others)
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高輝度XRD (RIGAKU RINT-SWXD)
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XRF (RIGAKU System3070E)
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示差熱天秤-質量分析同時測定装置 (RIGAKU TG-DTA/GC-MS)
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Inductively coupled plasma-atomic emission spectrometer (ICP-AES) (Seiko Instruments Inc. SPS7000A)
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Fourier transform infrared spectrometer (SHIMADZU FTIR8200PC)
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微小部XRD (RIGAKU PSPC-MDG2000)
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IC分析装置 (横河電機 IC500)
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Fluorophotometer (HITACHI F4500)
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Ultraviolet and visible spectrophotometer (SHIMADZU UV-3100PC)
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Thermogravimetric-differential thermal analyzer (RIGAKU TG8110D)
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Atomic absorption photometer (Seiko Instruments Inc. SAS-760)
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時間分解フォトルミネッセンス蛍光分光光度計 (堀場製作所 NAES-700 一式)
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Portable XRF (Seiko Instruments Inc. SEA2001)
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Thermal analyzer (Seiko Instruments Inc. SSC5000 and others)
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表面粗計 (Kosaka Lab. SE1700)
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Image analyzer (Nikon LUZEX 3)